Method to transfer failure analysis-specific data between data between design houses and fab's/FA labs
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United States of America Patent
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Issued Date -
Jan 1, 2009
app pub date -
Jun 28, 2007
filing date -
Jun 28, 2007
priority date (Note) -
Abandoned
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Abstract
A method and system for an IC design house to transfer design and layout information to a fabrication or failure analysis facility on a need-to-know basis to enable effective failure analysis while not providing unnecessary or extraneous information.
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