TWO STEP CHEMICAL MECHANICAL POLISH

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United States of America Patent

APP PUB NO 20080318420A1
SERIAL NO

11766922

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In one embodiment, a method includes providing two structures with a spacing therebetween over a semiconductor substrate, providing a conformal first layer over the two structures and within the space therebetween, depositing a conformal protective layer over the first layer, planarizing the protective layer until a top surface of the first layer is exposed, and planarizing the first layer and the protective layer until a top surface of the two structures is exposed and a portion of the protective layer is between the two structures.

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Patent Owner(s)

Patent OwnerAddress
PROMOS TECHNOLOGIES PTE LTD30 TOH GUAN ROAD # 08-09 ODC DISTRICENTRE 608840

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gan, Weechen Cupertino, CA 1 0
Wong, Denny K Fremont, CA 1 0
Zhang, Xinyu Palo Alto, CA 227 388

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