POSITIVE RESIST COMPOSITION AND METHOD OF PATTERN FORMATION WITH THE SAME

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United States of America Patent

SERIAL NO

12193302

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Abstract

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A positive resist composition comprising: (A) a resin which comes to have an enhanced solubility in an alkaline developing solution by an action of an acid; (B) a compound which generates an acid upon irradiation with actinic rays or a radiation; (C) a fluorine-containing compound containing at least one group selected from the groups (x) to (z); and (F) a solvent, and a method of pattern formation with the composition: (x) an alkali-soluble group; (y) a group which decomposes by an action of an alkaline developing solution to enhance a solubility in an alkaline developing solution; and (z) a group which decomposes by an action of an acid.

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Patent Owner(s)

Patent OwnerAddress
FUJIFILM CORPORATION26-30 NISHIAZABU 2-CHOME MINATO-KU TOKYO 106-8620

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Inabe, Haruki Shizuoka, JP 42 1026
KANDA, Hiromi Shizuoka, JP 50 897
Kanna, Shinichi Shizuoka, JP 104 1342

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