METHOD FOR ESTIMATING EXAMINEE ATTRIBUTE PARAMETERS IN A COGNITIVE DIAGNOSIS MODEL
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United States of America Patent
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Issued Date -
Nov 20, 2008
app pub date -
Jul 9, 2008
filing date -
Apr 6, 2004
priority date (Note) -
Abandoned
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Abstract
A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.
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