Determination of field distribution
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United States of America Patent
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Jul 17, 2012
Grant Date -
Nov 20, 2008
app pub date -
Nov 25, 2005
filing date -
Nov 25, 2005
priority date (Note) -
Expired
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Abstract
A method for determining field intensity for a particle on a substrate, the method comprising providing an incident wave, determining an electric vector of the field and a magnetic vector of the field inside and outside of the particle, and determining additional scattered fields inside and outside of the particle due to reflection of the incident wave from the substrate.
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