CLEANING APPARATUS FOR A PROBE
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United States of America Patent
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Issued Date -
Nov 13, 2008
app pub date -
May 5, 2008
filing date -
May 10, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The present invention provides a cleaning apparatus capable of removing foreign matters attached to a tip of a probe effectively without impairing the durability of the probe. The cleaning apparatus for the probe comprises a base plate having a rough surface and a surface layer formed to conform to and cover the rough surface for the purpose of providing a polishing surface for the probe and having lower hardness than hardness of the probe tip of the probe.
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