DUAL MEASUREMENT ANALYTE DETECTION SYSTEM
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United States of America Patent
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Issued Date -
Oct 30, 2008
app pub date -
Jul 10, 2008
filing date -
Apr 15, 2003
priority date (Note) -
Abandoned
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Abstract
An analyte detection system is configured to measure concentrations of at least first and second analytes in a single material sample supported by a sample element. The measurement of a second analyte can be conditioned on a quantitative or qualitative result of the first measurement. In one embodiment, the first analyte is glucose and the second analyte is a ketone. According to such an embodiment the ketone is measured if the result of the glucose measurement exceeds a previously-specified value or falls outside of a previously-specified range.
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