Device for Measuring Brain Parameters
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United States of America Patent
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Issued Date -
Oct 23, 2008
app pub date -
Jan 21, 2006
filing date -
Feb 24, 2005
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A device (1) is used for measuring brain parameters. This device has a catheter sensor unit (2) which can be implanted distally in a minimally-invasive manner in the parenchyma and/or the ventricles, guided through the cranial bone (4). The sensor unit (2) can be fixed proximally to the cranial bone. For this purpose a proximal circumferential portion of the sensor unit (2) has a self-cutting outer screw thread (5) for fastening the sensor unit (2) to the cranial bone (4). The result is a device which can be fastened in a secure, permanent and at the same time inexpensive manner preventing movement relative to the cranial bone.
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