Method of testing a semiconductor integrated circuit
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United States of America Patent
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Issued Date -
Oct 9, 2008
app pub date -
Apr 3, 2008
filing date -
Apr 9, 2007
priority date (Note) -
Abandoned
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Abstract
A method of testing a semiconductor integrated circuit is disclosed. Specifically, a method of testing a semiconductor integrated circuit comprising a plurality of flip-flops is provided. The disclosed method includes connecting the plurality of flip-flops in series so that the plurality of flip-flops forms a scan-chain; inputting data to the scan-chain while supplying a clock signal to the plurality of flip-flops so that the data is set in the plurality of flip-flops; retaining the data in the plurality of flip-flops while inhibiting the clock signal for a predetermined period; restarting the clock signal to the plurality of flip-flops so that the data retained in the plurality of flip-flops is output from the scan-chain; and comparing the data output from the scan-chain and the data input to the scan-chain to test data retention of the plurality of flip-flops.
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