Transistor Based on Resonant Tunneling Effect of Double Barrier Tunneling Junctions

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United States of America Patent

APP PUB NO 20080246023A1
SERIAL NO

11663684

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Abstract

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The present invention relates to a transistor based on resonant tunneling effect of double barrier tunneling junctions comprising: a substrate, an emitter, a base, a collector and a first and a second tunneling barrier layers; wherein the first tunneling barrier layer is located between the emitter and the base, and the second tunneling barrier layer is located between the base and the collector; furthermore, the junction areas of the tunneling junctions which are formed between the emitter and the base and between the base and collector respectively are 1 .mu.m.sup.2.about.10000 .mu.m.sup.2; the thickness of the base is comparable to the electron mean free path of material in the layer; the magnetization orientation is unbounded in one and only one pole of said emitter, base and collector. Because the double-barrier structure is used, it overcomes the Schottky potential between the base and the collector. Wherein the base current is a modulating signal, the collector signal is modulated to be similar to the base current's modulating mode by changing the magnetization orientation of the base or the collector, i.e., the resonant tunneling effect occurs. An amplified signal can be obtained under the suitable conditions.

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Patent Owner(s)

Patent OwnerAddress
INSTITUTE OF PHYSICS CHINESE ACADEMY OF SCIENCES100080 NO 8 SOUTH THIRD STREET HAIDIAN DISTRICT BEIJING ZHONGGUANCUN MUNICIPAL DISTRICT BEIJING CITY 100080

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Du, Guanxiang Beijing, CN 2 25
Feng, Jiafeng Beijing, CN 3 168
Han, Xiufeng Beijing, CN 20 432
Li, Feifei Beijing, CN 87 382
Wang, Tianxing Beijing, CN 12 137
Zeng, Zhongming Beijing, CN 17 117
Zhan, Wenshan Beijing, CN 3 45

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