Multi-type test interface system and method
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United States of America Patent
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Issued Date -
Oct 2, 2008
app pub date -
Jul 10, 2007
filing date -
Apr 2, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Efficient automated testing systems and methods are presented. In one embodiment, an automated testing system includes a plurality of bucket modules, and a device under test transition interface. The plurality of bucket modules have similar external connection form factors for a variety of instruments. The interface is for transitioning connections from the plurality of bucket modules to a device under test.
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