Semiconductor testing instrument to determine safe operating area
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United States of America Patent
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Issued Date -
Sep 18, 2008
app pub date -
Mar 8, 2006
filing date -
Oct 11, 2002
priority date (Note) -
Abandoned
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Abstract
An instrument for determination of the dc safe area of operation of a semiconductor device-under-test comprises a means to apply an adjustable bias at the input of a device-under-test, wherein the means comprises a dc biaser to apply a dc bias at a bias point within the safe operating limit, and a variable biaser subsequently to apply a variable bias comprising fast, superimposed rectangular bipolar pulses, and wherein the instrument further comprises means to measure the current response thereto so as to permit extrapolation of a detailed I-V response in the vicinity of the safe operating limit. A method of determination of the dc safe area of operation of a semiconductor device-under-test is also described.
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