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Abstract

A novel information system for optimizing a phase in the lifespan of a probe card for semiconductor wafer testing, by receiving, storing, and disseminating probe card data over a network between the probe card customer and supplier. The system optimizes the ordering of a probe card by a customer, the manufacture of the probe card by a supplier, and the performance and repair of the probe card during its lifespan. The information system includes at least one server that is coupled to a network, where the server receives, stores, and disseminates historical information gathered during the order, manufacture, performance, and repair phases of many probe cards. An application on the server receives current information from a probe card customer or supplier, calculates a variety of metrics based on this information, compares the metric to historical data already stored in the system, and communicates the results of the comparison and the historical data to a system user. Other advantageous features include probe cards equipped with attached data storage devices, such as radio frequency identification (RFID) tags, allowing the customer and supplier to store and easily access current order, manufacture, performance, and repair information on a particular probe card. The system may also automatically receive current information, calculate metrics, compare the metrics to historical data, and communicate the results of the comparison and the historical data to the customer or supplier using the system.

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First Claim