Gas Concentration Measuring Method, Program and Apparatus With Determination of Erroneous Detection
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United States of America Patent
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Issued Date -
Sep 18, 2008
app pub date -
Mar 14, 2008
filing date -
Mar 15, 2007
priority date (Note) -
Abandoned
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Abstract
In a wave number region of measurement of a gas to be measured, an absorbance of the gas is found to calculate a concentration thereof, and the concentration is compared with a threshold value (FIG. 3; S8). When the concentration exceeds the threshold value, an absorbance of an interference-component gas is found to calculate a concentration thereof in a wave number region of measurement of the interference-component gas (S9). The concentration of the interference-component gas is compared with a threshold value of the concentration of the interference-component gas (S10) to generate information indicating that the concentration of the gas to be measured is high when the concentration of the interference-component gas is within the threshold value (S11).
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