OP-CODE BASED BUILT-IN-SELF-TEST
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United States of America Patent
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Issued Date -
Aug 14, 2008
app pub date -
Jan 3, 2008
filing date -
Feb 12, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A built-in-self-test (BIST) system for testing a memory that includes a scheduler module that generates a first test algorithm based on a set of operational codes. Each operational code defines a test operation to be performed by the first test algorithm on the memory. The BIST system also includes an execution module that applies the first test algorithm to the memory.
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