PROBE AND PROBE ASSEMBLY
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United States of America Patent
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N/A
Issued Date -
Aug 14, 2008
app pub date -
Jan 21, 2008
filing date -
Feb 9, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The present invention provides a probe in which electrical short-circuit between the probes adjacent to each other is reliably prevented and that is manufactured relatively easily. The present invention provides a probe comprising a probe main body made of a plate-shaped member having an attachment region having an attachment end portion and extending in a direction distanced from the attachment end portion, an arm region continuing into the attachment region and extending in a direction intersecting with the extending direction of the attachment region, and a probe tip region intersecting with the longitudinal direction of the arm region, extending from the arm region to the opposite side of a side where the attachment end portion of the attachment region is located, seen from the arm portion, and having a probe tip at its extending end portion. On at least one surface of the probe is formed an insulating film made of a photosensitive electrically insulating material that exposes the attachment end portion of the attachment region.
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