Test Handler Having Size-Changeable Test Site

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United States of America Patent

APP PUB NO 20080191687A1
SERIAL NO

11817192

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Abstract

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A test handler (122) of the present invention includes a main body, a window (142) formed on a surface of the main body and having a size corresponding to a Hi-Fix board of M.times.N array (where M and N represent an integer greater than a value of =), a cover (170) detachably fixed to the main body t close a part of the window and convert the window into the test site having a size corresponding to a [M-A).times.(n-B)] Hi-Fix board (where A is an integer equal to ot greater than 0 but smaller than M, and B is an integer having a value other than 0). In the test handler, the size of window is easily modified to adapt that of the Hi-Fix board of M.times.N array by closing or opening a part of the window using the cover. Therefore, the test handler is capable of applying Hi-Fix boards having different sizes.

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Patent Owner(s)

Patent OwnerAddress
TECHWING CO LTDSOUTH KOREA GYEONGGI DO CITY CHINA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jeon, In Gu Gyeonggi-do, KR 14 51
Na, Yun Sung Chungcheongnam-do, KR 16 60
Shim, Jae Gyun Gyeonggi-do, KR 12 60

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