MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME
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United States of America Patent
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Issued Date -
Aug 7, 2008
app pub date -
Jun 22, 2007
filing date -
Feb 2, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A measuring system (100) includes a measuring instrument (10) and a processing device (20). The measuring instrument includes a base (12), a guide column (14), a sliding member (16), and a digital micrometer (18). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The processing device is electronically connected with the digital micrometer. The processing device receives a measured value from the digital micrometer and diplays a testing result after processing the measured value.
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