METHOD AND SYSTEM FOR CREATING KNOWLEDGE AND SELECTING FEATURES IN A SEMICONDUCTOR DEVICE
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United States of America Patent
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Issued Date -
Jul 24, 2008
app pub date -
Jan 24, 2007
filing date -
Jan 24, 2007
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Abandoned
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Abstract
A method and system for creating knowledge and selecting features in a supervised classifier is disclosed. The method and system comprises changing a feature space of a plurality of defects and marking at least a portion of the samples of the defects in the feature space. The method and system includes labeling the at least a portion of the samples as training samples, determining if the training samples are of the same type and creating knowledge based upon the training samples if the samples are of the same type.
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