System for providing a reference voltage to a semiconductor integrated circuit
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United States of America Patent
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Oct 4, 2011
Grant Date -
Jun 26, 2008
app pub date -
Jul 25, 2007
filing date -
Dec 21, 2006
priority date (Note) -
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Abstract
A system for providing a reference voltage includes a tester adapted to provide a predetermined current, a first ground pad connected to a ground voltage of the tester, a second ground pad connected between the tester and the first ground pad, the second ground pad being connected to the tester through first and second resistors, a reference voltage pad connected to a node between the first and second resistors, the reference voltage pad adapted to provide a test reference voltage, and a multiplexer connected to the reference voltage pad, the multiplexer configured to output the test reference voltage as a reference voltage during substantial voltage variation.
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