Method of Identifying Sugar Chain Structure and Apparatus For Analyzing the Same

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United States of America Patent

APP PUB NO 20080139396A1
SERIAL NO

10593157

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Abstract

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An object of the present invention is to provide a system for analyzing a sugar chain structure which can determine a complete primary structure of a sugar chain simply and rapidly with a small amount of sample. In a method of identifying an analysis-objective sugar chain structure using a mass spectrometer by comparing a measured MS3 fragment pattern with a reference MS3 fragment pattern stored in a database, where the measured MS3 fragment pattern is a fragmentation pattern of each MS2 fragment ion included in a measured MS2 fragment pattern obtained by subjecting the analysis-objective sugar chain to a fragmentation mass spectroscopy, the present invention is characterized in that, among a plurality of MS2 fragment ions included in a measured MS2 fragment pattern, a fragmentation mass spectroscopy is performed on only selected MS2 fragment ions, where each of the selected fragmentations has a plurality of reference MS3 fragment patterns stored in a database whose mutual similarity index is smaller than a predetermined value, wherein the plurality of reference MS3 fragment patterns have the same precursor ion mass to charge ratio as that of the selected MS2 fragment ion.

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Patent Owner(s)

Patent OwnerAddress
SHIMADZU CORPORATIONKYOTO-SHI KYOTO 604-8511
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYTOKYO 100-8921
MITSUI KNOWLEDGE INDUSTRY CO LTD2-5-1 ATAGO MINATO-KU TOKYO 105-6215

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kameyama, Akihiko Ibaraki, JP 9 46
Kikuchi, Norihiro Tokyo, JP 3 3
Nakaya, Shuuichi Kyoto, JP 3 5
Narimatsu, Hisashi Ibaraki, JP 53 126

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