Chemical composition for chemical mechanical planarization

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United States of America Patent

APP PUB NO 20080135520A1
SERIAL NO

11637536

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Abstract

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The chemical composition for a slurry for chemical mechanical planarization includes abrasive particles selected from the group consisting of SiO.sub.2, Al.sub.2O.sub.3, TiO.sub.2, and CeO.sub.2, and combinations thereof, and a silicate oligomer as a rate accelerator. The slurry may include an organic dispersion agent, and preferably has a has a pH in the range of about 4 to about 12.

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Patent Owner(s)

Patent OwnerAddress
JIANGSU SINO KRYSTALS OPTRONICS TECHNOLOGY CO LTD8 WEST LAKE ROAD WUJIN HIGH TECH PARK CHANGZHOU JIANGSU 213164

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sun, Tao Arcadia, CA 269 1665

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