EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD

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United States of America Patent

APP PUB NO 20080079426A1
SERIAL NO

11862897

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTD6-6 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 100-8280
HITACHI ENGINEERING & SERVICES CO LTD2-2 SAIWAI-CHO 3-CHOME HITACHI-SHI IBARAKI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Adachi, Yuuji Hitachi, JP 5 20
Isaka, Katsumi Mito, JP 4 20
Kodaira, Kojirou Hitachinaka, JP 6 66
Koike, Masahiro Hitachi, JP 79 719
Kumasaka, Kenji Hitachi, JP 5 30
Matsui, Tetsuya Hitachi, JP 46 533
Odakura, Mitsuru Hitachi, JP 7 37
Suzuki, Kazuhiro Hitachi, JP 441 5675
Suzuki, Yutaka Hitachi, JP 191 3549
Tayama, Kenji Mito, JP 8 59

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