Method and apparatus for evaluating data
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United States of America Patent
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Issued Date -
Mar 20, 2008
app pub date -
Aug 15, 2007
filing date -
Aug 17, 2006
priority date (Note) -
Abandoned
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Abstract
A method and apparatus for evaluating data are provided. The method comprises the steps of acquiring waveform data, performing one or more measurements on the waveform data to generate measurement data, applying a filter to the generated measurement data and generating a histogram in accordance with the filtered measurement data. One or more rarest values from the histogram are designated in accordance with the filtered measurement data, and an additional filter is generated in accordance with the one or more designated rarest values. The additional filter is applied to the generated measurement data.
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