SYSTEMS AND METHODS FOR CORRECTING FOR UNEQUAL ION DISTRIBUTION ACROSS A MULTI-CHANNEL TOF DETECTOR
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United States of America Patent
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Issued Date -
Mar 6, 2008
app pub date -
Aug 29, 2007
filing date -
Aug 30, 2006
priority date (Note) -
Abandoned
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Abstract
Systems and methods for calculating ion flux. In one embodiment, a mass spectrometer includes an ion source for emitting a beam of ions from a sample and at least one detector positioned downstream of said ion source. The at least one detector comprises a plurality of detector channels. The mass spectrometer also includes a controller operatively coupled to the plurality of detector channels. The controller is configured to: determine ion abundance data correlated to each detector channel; determine corrected ion abundance data correlated to each detector channel; determine confidence data corresponding to the ion abundance data for each of the detector channels; and determine a confidence weighted abundance estimate of the ion flux correlated to both the ion abundance data and to the confidence data.
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