Apparatus and Method For Generating Test Pattern Data For Testing Semiconductor Device
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United States of America Patent
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Issued Date -
Feb 14, 2008
app pub date -
Jul 30, 2007
filing date -
Aug 9, 2006
priority date (Note) -
Abandoned
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Abstract
An apparatus and a method for generating a test pattern data for testing a semiconductor device are disclosed. In accordance with and in particular to the apparatus and the method, a test pattern program is compiled by predicting a data operation to generate a test pattern data in an interleaved fashion, thereby eliminating a need for a developer of the test pattern program to analyze the data operation during a writing of a source code.
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