Terahertz Time Domain Sensing to Derive Physical Characteristics of an Object by Evaluating the Contribution of Surface Waves to the Reflected/Scattered Time Domain Waveform
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United States of America Patent
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Issued Date -
Feb 14, 2008
app pub date -
Jul 8, 2005
filing date -
Jul 16, 2004
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Abandoned
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Abstract
The present invention provides a method of analysing an object (29) (for example a wive or a steut), comprising the steps of: (a) irradiating the object with a Terahertz pulse of electromagnetic radiation, such that a portion of the irradiating radiation couples to the object as a surface wave; (b) detecting radiation reflected and/or scattered from the object to obtain a time domain waveform; (c) extracting the parts of the radiation detected in step (b) relating to the surface wave on the object and (d) analysing the radiation identified in step (c) in order to derive information relating to a physical characteristic (for example the thickness of a coating) of the object.
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