Spectrometer system with IR microscope and electronically switchable detectors
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United States of America Patent
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Issued Date -
Feb 14, 2008
app pub date -
Jul 18, 2007
filing date -
Aug 10, 2006
priority date (Note) -
Abandoned
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Abstract
A spectrometer system (1) comprising an IR (infrared) spectrometer (2) and an IR microscope (3), wherein a sample (42) and a first detector (21; 31) are provided in the IR microscope (3), wherein the IR microscope (3) is designed such that during measurement, the sample (42) is imaged on the first detector (21; 31) via an intermediate focus (44), is characterized in that at least one second detector (24, 25; 33) is provided whose detector surface (26, 27; 34) extends parallel to the detector surface (22; 32) of the first detector (21; 31), the detector surface (26, 27; 34) of the at least one second detector (24, 25; 33) is at least 5 times larger than the detector surface (22; 32) of the first detector (21; 31), and the first (21; 31) and the at least one second detector (24, 25; 33) are disposed directly next to each other, wherein the detector surface (26, 27; 34) of the at least one second detector (24, 25; 33) largely surrounds the detector surface (22; 32) of the first detector (21, 31), and the first detector (21; 31) can be read out independently of the at least one second detector (24, 25; 33). The inventive spectrometer system yields a good signal-to-noise ratio both for large and small selected sample areas.
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