Tester For Testing Semiconductor Device
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United States of America Patent
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Issued Date -
Feb 7, 2008
app pub date -
Jul 25, 2007
filing date -
Aug 1, 2006
priority date (Note) -
Abandoned
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Abstract
A tester for testing a semiconductor device is disclosed. In accordance with the tester, a data is fetched using a data strobe signal transmitted from a DUT, thereby increasing an accuracy of the fetched data, securing a window for fetching a last portion of the data using a data strobe enable signal and efficiently compensating for a round trip delay of an expected data without using the deskew component.
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