SELF-ALIGNING SCANNING PROBES FOR A SCANNING PROBE MICROSCOPE
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Jan 24, 2008
app pub date -
May 18, 2007
filing date -
May 26, 2006
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
Scanning probes are provided for alternative use in a scanning probe microscope. The scanning probes have micro cantilever beams of different lengths whose one end has a scanning tip for scanning a sample and whose other end has a holding element for the non-permanent attachment of the scanning probe to a support element secured in position on a probe holder, and where corresponding alignment elements are incorporated in the holding element and in the support element that align the holding element in automatically reproducible fashion relative to the probe holder when coupled with the support element. The distance between the scanning tip and a defined reference point of the holding element is constant in each case so that an alignment of the scanning probe in longitudinal direction is not necessary when the scanning probe is exchanged.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully