System and method of assessing reliability of a semiconductor
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United States of America Patent
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Issued Date -
Jan 17, 2008
app pub date -
May 3, 2006
filing date -
May 3, 2006
priority date (Note) -
Abandoned
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Abstract
A system for assessing reliability of a semiconductor product design, the system comprising a first database for storing circuits data specifying cells of available circuits for semiconductor products; an input unit for input of reliability qualification data of tested semiconductor products; an uploading unit for uploading semiconductor product design data; and a processor for processing the reliability qualification data to generate reliability data at a circuit-level, a cell-level, or both utilizing the circuits data, and for assessing the reliability of the semiconductor product design based on the generated reliability data.
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