Probe Cards
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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N/A
Issued Date -
Jan 10, 2008
app pub date -
Jun 8, 2005
filing date -
Jun 8, 2004
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A probe card for testing IC circuits is provided that comprises a probe member for each IC contact that comprises a flexible membrane structure secured at two points to a reverse surface of a substrate. A contact means can also be provided, which can be a probe bump or a specially shaped recess. Force limiting means can be provided so that the force applied can be controlled and damage of the IC to be tested can be limited.
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