Probe using high pass ground signal path
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United States of America Patent
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Apr 14, 2009
Grant Date -
Jan 3, 2008
app pub date -
Jun 29, 2006
filing date -
Jun 29, 2006
priority date (Note) -
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Abstract
A method and apparatus for probing an electrical signal. The apparatus comprises simplified circuit, comprising an input pin for receiving an input signal having an inductance and parasitic capacitance associated therewith and a first resistor coupled between the input pin and an output. A first capacitor is coupled between the first resistor and the output, and a ground. A second capacitor and an associated inductance in series are coupled between the junction of the first resistor and first capacitor and a parallel circuit arrangement. The parallel circuit comprises a second resistor and second associated inductance coupled in parallel between the first inductor and ground.
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