System and Method for Optimizing Data Acquisition of Plasma Using a Feedback Control Module

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United States of America Patent

SERIAL NO

11661067

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Abstract

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Method, systems and computer readable media for optimizing data acquisition of microwave plasma are disclosed. The present invention provides a method that includes the steps of selecting an operational condition for a plasma generation system, operating the plasma generation system under the selected operational condition, determining whether a stable plasma is established using a sensing device and acquiring/storing plasma data if the stable plasma is established. The method further includes a step of repeating data acquisition under various operational conditions to establish a database for plasma characterization. The present invention further provides a feedback control module that operates in conjunction with a plasma generating system to automate and optimize the process of data acquisition.

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Patent Owner(s)

Patent OwnerAddress
AMARANTE TECHNOLOGIES INC5237 APENNINES CIRCLE SAN JOSE CA 95138
SAIAN CORPORATION579-1 UMEHARA WAKAYAMA-SHI WAKAYAMA 640-8550

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Jay Joongsoo Los Altos, CA 12 397
Lee, Sang Hun San Ramon, CA 218 1251

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