Method of testing electrochemical cells
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United States of America Patent
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Issued Date -
Dec 6, 2007
app pub date -
Jan 10, 2005
filing date -
Jan 9, 2004
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Abstract
A method for determining whether a cell will experience unacceptable voltage delay later in its discharge life before it is incorporated into a device as its power source is described. As is standard practice, the cell is first subjected to a constant resistance load discharge followed by extended elevated temperature storage and an acceptance pulse discharge. This typically depletes the cell of about 1% to 3% of its theoretical discharge capacity. According to the present invention, the cell is again stored at an elevated temperature for an extended period followed by a second pulse discharge. This second pulse discharge is to ferret out any cell that may end up experiencing unacceptable voltage delay later in its discharge life.
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