Embedded inspection image archival for electronics assembly machines
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United States of America Patent
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Issued Date -
Nov 29, 2007
app pub date -
May 23, 2006
filing date -
May 23, 2006
priority date (Note) -
Abandoned
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Abstract
A pick and place machine includes a vision system for acquiring at least one image relative to at least one component-related operation within the pick and place machine. The at least one image is stored along with one or more trace keys associated with the component-related operation. A database of images and associated trace keys can then be used to analyze operation of the pick and place machine to identify aspects that are out of control, or threaten to be out of control.
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