PROBE, TESTING HEAD HAVING A PLURALITY OF PROBES, AND CIRCUIT BOARD TESTER HAVING THE TESTING HEAD
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United States of America Patent
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N/A
Issued Date -
Nov 15, 2007
app pub date -
May 10, 2007
filing date -
May 12, 2006
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A probe and a testing head including the probe is used for inspecting electric characteristics of a wiring pattern of circuit board. The testing head includes a guiding member having a first guiding base having a first through hole, and a second guiding base arranged to face the first guiding base with a gap defined therebetween and having a second through hole aligned with the first through hole. The probe includes a first pin body having a measuring end arranged to be in contact with the circuit board, a measuring-end side of the first pin body is slidably supported in the first through hole of the first guiding base and the other-end side is slidably supported in the second through hole of the second guiding base. The probe also includes a second pin body arranged coaxial with the first pin body and supported in the second through hole. The second pin has one end directed to the other end of the first pin body and an external connection end to be connected to an electrode. A coil spring supported in the second through hole in a compressible manner, one end of the coil spring is electrically connected to the other end of the first pin body, and the other end of the coil spring is electrically connected to the one end of the second pin body.
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