DEVICE FOR DETECTING DEFECTS ON METALS
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United States of America Patent
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Issued Date -
Oct 25, 2007
app pub date -
Apr 20, 2007
filing date -
Apr 21, 2006
priority date (Note) -
Abandoned
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Abstract
A stray flux measurement device for detection of defects near the surface and remote from the surface on ferromagnetic specimens (10) is characterized by at least one coil (20) or an equivalently acting core/coil combination that faces the specimen (24, 22) and at least one coil (30, 40) or an equivalently acting core/coil combination (34, 32; 44, 42) that faces at an angle relative to the surface of the specimen.
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