Polishing method that suppresses hillock formation

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20070235345A1
SERIAL NO

11400454

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Abstract

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An ECMP method that suppresses hillock formation on a substrate includes the step of buffing a substrate before a two-step electrochemical mechanical polishing process. The buffing step prevents hillocks from forming around the features of the substrate and does not interfere with the protrusion formation. The buffing step includes contacting the substrate with a polishing pad and rotating the substrate and the polishing pad in opposite directions.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Du, Tianbao Santa Clara, CA 10 50
Duboust, Alan Sunnyvale, CA 1 4
Hsu, Wei-Yung Santa Clara, CA 99 1485
Liu, Feng Q San Jose, CA 120 1576
Yu, May Fremont, CA 3 11

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