Means and method for analyzing samples by mass spectrometry
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United States of America Patent
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Issued Date -
Sep 27, 2007
app pub date -
Mar 24, 2006
filing date -
Mar 24, 2006
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Abandoned
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Abstract
Disclosed is an improved method for performing a mass spectrometric analysis of a sample. More specifically, the present invention provides a method wherein analyte is transferred in a spatially coherent manner from a sample to the surface of a semiconductor. Laser light is used to produce gas phase ions directly from analyte adsorbed to the semiconductor surface. Analyte ions and the mass spectra produced therefrom are used to determine the distribution of analyte on the surface of the sample.
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