INTEGRATED CIRCUIT TEST RESULT COMMUNICATION
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United States of America Patent
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Issued Date -
Sep 27, 2007
app pub date -
Sep 6, 2006
filing date -
Mar 17, 2006
priority date (Note) -
Abandoned
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Abstract
A chip has formed thereon integrated circuit elements, which include a main circuit and an associated non volatile memory structure. A test result associated with prior testing of a function of the main circuit is stored in the non volatile memory structure. Additional apparatus and methods are disclosed.
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