Message system for logical synchronization of multiple tester chips

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United States of America Patent

APP PUB NO 20070220380A1
SERIAL NO

11385099

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Abstract

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A message system for logically synchronizing a large number of tester chips includes a message pipeline for multiple sets of tester chips. Each set of tester chips includes a delay unit through which messages are communicated to the message pipeline from the set of tester chips and from the message pipeline to the set of tester chips, and a message accumulation unit for temporarily holding the messages communicated from the message pipeline to the set of tester chips. The message pipeline runs at a first clock rate that is governed by a first clock source and the messages are communicated to the set of tester chips from the message accumulation unit at a second clock rate that is governed by a second clock source that is different from the first clock source.

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Patent Owner(s)

Patent OwnerAddress
CREDENCE SYSTEMS CORPORATION1421 CALIFORNIA CIRCLE MILPITAS CA 95035

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ohanyan, Mamikon Fremont, CA 1 42

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