Rfid Paper Manufacturing Apparatus and Inspection Method of Rfid Paper Manufacturing Apparatus

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United States of America Patent

APP PUB NO 20070216525A1
SERIAL NO

11574560

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Abstract

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The present invention provides an RFID paper manufacturing apparatus and an inspection method of an RFID paper manufacturing apparatus with which the location of a fault in the apparatus causing a defect in an RFID tag can be specified easily. An RFID label manufacturing apparatus comprises: a reader/writer for performing at least one of reading the information stored in the RFID tag and writing information to the RFID tag; a plurality of antennas disposed in a plurality of predetermined positions on a path along which the RFID tag is conveyed, for transmitting and receiving information to/from the RFID tag; a switching circuit for switching the antenna that is connected to the reader/writer; and a CPU for detecting an error in at least one of the information writing and the information reading performed by the reader/writer via the antenna that is connected to the reader/writer by the switching operation of the switching circuit.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA SATOTOKYO JAPAN TOKYO METROPOLIS

International Classification(s)

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  • 2005 Application Filing Year
  • G08B Class
  • 2064 Applications Filed
  • 1188 Patents Issued To-Date
  • 57.56 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20052006200720082009201020112012201320142015201620172018201920200255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Suzuki, Hiroyuki Tokyo, JP 847 10497
Toshiaki, Abe Tokyo, JP 1 8

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  • 8 Citation Count
  • G08B Class
  • 1.27 % this patent is cited more than
  • 18 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges51819249261187512701 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0102030405060708090100110120130140150160170180190200

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