INTEGRATED, MULTI-STEP COMPUTER IMPLEMENTED SYSTEM AND METHOD FOR MEASURING AND IMPROVING MANUFACTURING PROCESSES AND MAXIMIZING PRODUCT RESEARCH AND DEVELOPMENT SPEED AND EFFICIENCY USING HIGH-THROUGHPUT SCREENING AND GOVERNING SEMI-EMPIRICAL MODEL
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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N/A
Issued Date -
N/A
app pub date -
Nov 30, 2006
filing date -
Jan 15, 2002
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
An integrated multi-step computer-implemented system and method for measuring and improving manufacturing processes and maximizing product research and development speed and efficiency includes a predictive model that predicts output from data input, an optimizer that optimizes input variables based upon desired output variables, and a library that stores data and information. The system further includes an artificial intelligence that receives requests and information from manufacturers and customers, and directs the requests and information to the predictive model if an output prediction is requested, to the optimizer if an optimized input is requested, or to the library if the requests cannot be answered by the predictive model or optimizer. The predictive model, the optimizer, and the library all interconnect with the artificial intelligence. The system further includes a high-throughput screening system that analyzes various material combinations and sends data to the library.
First Claim
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