High frequency cantilever-type probe card
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United States of America Patent
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N/A
Issued Date -
Aug 30, 2007
app pub date -
Feb 9, 2007
filing date -
Aug 4, 2005
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A cantilever-type probe card includes a circuit board having a first surface on which a plurality of signal contact pads and grounding contact pads are formed, a locating ring mounted on the first surface of the circuit board, and a plurality of probe pins, each of which is partially supported by the locating ring. Each of the probe pins has an electrically conducting core having an exposed first end electrically connected to one of the signal contact pads of the circuit board, and an exposed second end suspending outside the locating ring for probing a test contact, and a metal film insulatively spaced from the electrically conducting core and electrically connected to one of the grounding contact pads of the circuit board.
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