Cleaning method of apparatus for depositing AI-containing metal film and AI-containing metal nitride film

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United States of America Patent

APP PUB NO 20070144557A1
SERIAL NO

11507828

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Abstract

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A dry cleaning method for an apparatus for depositing a thin film that deposits an Al-containing metal film and an Al-containing metal nitride film is provided. The method includes maintaining a temperature inside of chamber of the apparatus for depositing a thin film at 430.degree. C. or higher and cleaning the inside of the chamber by supplying a cleaning gas including Cl.sub.2 into the chamber. When it is difficult to maintain the temperature inside the chamber at 430.degree. C. or higher, the method includes cleaning the inside of the chamber by using a cleaning gas including Cl.sub.2 plasma. Accordingly, the apparatus for depositing the thin film that deposits a titanium aluminum nitride (TiAlN) film and a similar type thin film can be effectively cleaned without having remaining products and particles.

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Patent Owner(s)

Patent OwnerAddress
INTEGRATED PROCESS SYSTEMS LTDGYEONGGI DO SOUTH KOREA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Ki-Hoon Yongin-si, KR 15 419
Lee, Sang-Jin Pyungtaek-si, KR 164 2068
Seo, Tae-Wook Suwon-si, KR 9 297

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