Nonvolatile memory devices having insulating spacer and manufacturing method thereof

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20070126054A1
SERIAL NO

11315295

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Abstract

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A nonvolatile memory device that effectively prevents the occurrence of the hump phenomenon as well as a manufacturing method for fabricating the same, is presented. In one embodiment, the nonvolatile memory device includes an insulating spacer formed at interface between the active region and isolation layer, and a charge trapping dielectric layer that is formed in the active region between the neighboring two insulating spacers. The device also includes a gate electrode layer formed on the charge trapping dielectric layer and a source and drain formed in the active region at both sides of the gate electrode layer.

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Patent Owner(s)

Patent OwnerAddress
DONGBUANAM SEMICONDUCTOR INCSEOUL SOUTH KEREAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jung, Jin Hyo Bucheon-si, KR 69 472

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