Tunable x-ray fluorescence imager for multi-element analysis
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United States of America Patent
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Issued Date -
May 17, 2007
app pub date -
Nov 14, 2005
filing date -
Nov 14, 2005
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Abandoned
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Abstract
A full-field x-ray fluorescence imager capable of recording high resolution maps of elemental concentrations with high signal to background in one image is described. Furthermore the methodology to have the same instrument record maps of different elements in series and how to register and overlay these maps properly is discussed.
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