METHOD FOR PROCESSING VALUES FROM A MEASUREMENT

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United States of America Patent

SERIAL NO

11619332

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Abstract

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A method for processing values from a measurement in a data set, such that there is recognition of corrupted values from the measurement. The method of the present invention is structured in such a manner that the values from a measurement are compared by means of a suitable measure of difference from a predefinable or determinable or model function and are evaluated via a predefinable or determinable error bound for that measure of difference.

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Patent Owner(s)

Patent OwnerAddress
MICRO-EPSILON MESSTECHNIK GMBH & COKONIGBACHER STRASSE 15 ORTENBURG 28280

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mandl, Roland Ortenburg, DE 10 344
Meyer-Hofer, Heidi Ortenburg, DE 1 56

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