Method of testing a substrate and apparatus for performing the same
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United States of America Patent
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Issued Date -
Mar 29, 2007
app pub date -
Sep 25, 2006
filing date -
Sep 26, 2005
priority date (Note) -
Abandoned
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Abstract
A method of testing a substrate may involve photographing a first chip on a first face of the substrate to obtain a first image of the first chip, and photographing a second chip on a second face of the substrate opposite to the first face without reversing the substrate to obtain a second image of the second chip. The normality of the first and the second chips may be determined based on the first and the second images.
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